2003 research

2003 research papers

S.D. Gunapala, S.V. Bandara, J.K. Liu, S.B. Rafol, C.A. Shott, R.W. Jones, S. Laband, J.T. Woolaway II, J.M. Fastenau, A.W.K. Liu, M.D. Jhabvala, and K.K. Choi, "640×512 Pixel Four-Band, Broadband, and Narrowband Quantum Well Infrared Photodetector Focal Plane Arrays", Proc. SPIE Vol. 4820, Infrared Technology and Applications XXVIII, Eds. B. Andresen, G.F. Fulop, and M. Strojnik (ISBN 0-8194-4588-6, SPIE, Washington, 2003), p. 306.

O. Malis, W.K. Liu, C. Gmachl, J.M. Fastenau, A. Joel, P. Gong, S.W. Bland, and N. Moshegov, "MBE Development of Dilute Nitrides for Commercial Long-wavelength Laser Applications", J. Cryst. Growth, 251, 432 (2003).

S.V. Bandara, S.D. Gunapala, F.M. Reininger, J.K. Liu, S.B. Rafol, J.M. Fastenau, and A.W.K. Liu, "Large-format Dual-broadband QWIP Focal Plane Array Imaging Interferometers for Detection of Toxic Gases", SPIE-AeroSense Conference, Orlando, FL, April 21-25, 2003, 5074-85 (invited).

D.I. Lubyshev, O. Malis, K. Teker, Y. Wu, J.M. Fastenau, X.-M. Fang, C. Doss, A.B. Cornfeld, and W.K. Liu, "Production of Next Generation InP-HBT Epiwafers by MBE", 15th International Conference on InP and Related Materials, Santa Barbara, CA, May 12-16, 2003, ThB2.2.

J. Lowmaster, R. Pelzel, M. Dydyk, and D. Green, "Use of Re-etched and Re-polished Epi-wafers for MBE Calibration Substrates", International Conference on GaAs Manufacturing Technology, Scottsdale, AZ, May 19-22, 2003, 3.2.

D.I. Lubyshev, K. Teker, O. Malis,Y. Wu, J.M. Fastenau, X.-M. Fang, C. Doss, A.B. Cornfeld, and W.K. Liu, "Commercial Production of Large Diameter InP-HBT Epiwafers by MBE", International Conference on GaAs Manufacturing Technology, Scottsdale, AZ, May 19-22, 2003, 3.3.

M. Dahlström, Z. Griffith, M. Urteaga, M.J.W. Rodwell, X.-M. Fang, D. Lubyshev, Y. Wu, J.M. Fastenau, and W.K. Liu, "InGaAs/InP DHBTs with >370 GHz ft and fmax using a Graded Carbon-Doped InGaAs Base", 61st Device Research Conference, Salt Lake City, UT, June 23-25, 2003.

M. Dahlström, X.-M. Fang, D. Lubyshev, M. Urteaga, S. Krishnan, N. Parthasarathy, Y.M. Kim, Y. Wu, J.M. Fastenau, W.K. Liu, and M.J.W. Rodwell, "Wideband DHBTs using a Graded Carbon-Doped InGaAs Base", IEEE Electron Device Letts. 24, 433 (2003).

D. Lubyshev, J. M. Fastenau, X.-M. Fang, Y. Wu, C. Doss and W.K. Liu, "Comparison of As- and P-Based Metamorphic Buffers for High Performance InP HBT and HEMT Applications", 21st North American Conference on Molecular Beam Epitaxy, Keystone, CO, September 29-October 2, 2003.

S.V. Bandara, S.D. Gunapala, F.M. Reininger, J.K. Liu, S.B. Rafol, J.M. Mumolo, D.Z.Y. Ting, R.W. Chuang, T.Q. Trinh, J.M. Fastenau, and A.W.K. Liu, "Large-Format Dual-Broadband QWIP Focal Plane Array Imaging Interferometers", Proc. SPIE Vol. 5074, Infrared Technology and Applications XXIX, Eds. B.F. Andresen and G.F. Fulop, (ISBN 0-8194-4991-1, SPIE, Washington, 2003), p. 787.

J Vukusic, P Modh, A Larsson, M Hammar, S Mogg, U Christiansson, V Oscarsson, E Ödling, J Malmquist, M Ghisoni, P Gong, E Griffiths, and A Joel, "MOVPE Grown GaInNAs VCSELs at 1.3 µm with a Conventional Mirror Design Approach", Electronics Letters.

A M Joel, "InGaAsN growth at IQE", at International Workshop on 'GaAs based lasers for the 1.3 - 1.5 µm wavelength range', Wroclaw, Poland, April 2003.

S W Bland, R T Blunt and S Westwater, "The application of optical metrology in the production of InGaP HBTs", E-MRS Spring Meeting, Strasbourg, June 2003.

J Mimila-Arroyo, S W Bland, S Cassette and S L Delage, "Burn-in effects in GaInP/GaAs/GaAs HBT's", Physica Status Solidi, 3, p902-906, 2003.

J.Mimila-Arroyo, S.W.Bland and A Lusson, "Carbon site switching in carbon doped GaAs, its dependence on carbon concentration", Superficies y Vacío, 16(1), p37-39, 2003.

J Mimila-Arroyo, V Cabrera, and S W Bland, "Dependence of burn-in effect on thermal annealing of the GaAs:C base layer in GaInP heterojunction bipolar transistors", Applied Physics Letters, 82(17), p2910-2912, 2003.

S. Westwater, S.W. Bland, and R.T. Blunt, "Rotational effects on particle size and reflectivity dependence upon haze measurements in optical scatterometry". E-MRS Spring Meeting, Strasbourg, France, June 2003.