W.K. Liu, D.I. Lubyshev, J.M. Fastenau, Y. Wu, and C. Doss
"Comparative Studies of the Epi-Readiness of 4" InP Substrtaes for MBE Growth"
22nd North American Conference on Molecular Beam Epitaxy, Banff, Canada, Oct. 10-14, P23.
J.M. Fastenau, D.I. Lubyshev, X.-M. Fang, C. Doss, Y. Wu, W.K. Liu, S. Bals, Z. Griffith, Y.-M. Kim, and M.J.W. Rodwell
"Strain Relaxation and Dislocation Filtering in Metamorphic HBT and HEMT structures Grown on GaAs Substrates by MBE"
16th International Conference on InP and Related Materials, Kagoshima, Japan, May 31-June 4, WP-8.
Martin Murtagh, Pat Kelly, and Roy Blunt
"Photoreflectance technique reduces need for destructive testing of VCSEL epiwafers"
Compound Semiconductor, March, 31 - 34.
J. Armstrong & R. Blunt
"White light interferometry for routine surface roughness measurement in a production environment"
EXMATEC 2004, Montpellier, France June.
M.E. Murtagh, V. Guenebaut, S.Ward, D. Nee, P.V. Kelly, B. O'Looney, F. Murphy, V. Modreanu, S. Westwater, R. Blunt, & S.W. Bland
"Photoreflectance spectroscopy study of vertical cavity surface emitting laser structures"
Thin Solid Films 450 148 - 140.
D.I. Lubyshev, J.M. Fastenau, X.-M. Fang, Y. Wu, C. Doss, A. Snyder, W.K. Liu, M.S.M. Lamb, S. Bals, and C. Song
"Comparison of As- and P-based Metamorphic buffers for High Performance InP Heterojunction Bipolar Transistor and High Electron Mobility Transistor Applications"
J. Vac. Sci. Technol. B, 22 1565.
Z. Griffith, M. Dahlström, M. Urteaga, M.J.W. Rodwell, X.-M. Fang, D. Lubyshev, Y. Wu, J.M. Fastenau, and W.K. Liu
InGaAs/InP Mesa DHBTs with Simultaneously High ft and fmax and Ccb/Ic Ratio"
IEEE Electron Device Letts. 25, 250.
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